data sheet doc. no : qw0905-LUR21233 rev : a date : 11 - feb. - 2006 super bright tower type led lamps LUR21233 ligitek electronics co.,ltd. property of ligitek only
note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation part no. LUR21233 package dimensions ligitek electronics co.,ltd. property of ligitek only page 1/4 3.0 7.5 3.7 25.0min 1.0min 0.5 typ 2.54 typ 1.5 max 3.0 3.5 4.5 + - -60 -30 0 30 60 25% 50% 75% 100%100% 75% 50% 25% 0
storage temperature tstg -40 ~ +100 red note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 ) emitted material part no LUR21233 gaalas soldering temperature spectral halfwidth nm peak wave length pnm viewing angle 2 1/2 (deg) min. water clear lens 66020450 typ. max. 1.52.4 220 min. 20 max 260 for 5 sec max (2mm from body) forward voltage @20ma(v) color tsol luminous intensity @20ma(mcd) absolute maximum ratings at ta=25 forward current peak forward current duty 1/10@10khz power dissipation reverse current @5v operating temperature parameter page 2/4 ur 10 120 120 40 -40 ~ +85 ratings i f t opr ir pd i fp symbol ma a mw ma unit ligitek electronics co.,ltd. property of ligitek only part no. LUR21233
ligitek electronics co.,ltd. property of ligitek only 0.0 0.8 f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 wavelength (nm) ambient temperature( ) fig.5 relative intensity vs. wavelength r e l a t i v e i n t e n s i t y @ 2 0 m a 1.0 0.0 600 0.5 -40-20 650700750 -40 80 20 04060100 ambient temperature( ) -20040 20100 80 60 1 f o r w a r d c u r r e n t ( m a ) r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a fig.3 forward voltage vs. temperature 0.9 1.0 1.1 1.2 0 1 1.0 1.0 0.5 1.5 2.0 2.5 3.0 1 fig.4 relative intensity vs. temperature forward voltage(v) 3.0 2.04.0 0.0 5.0 0.5 forward current(ma) 100 101000 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 10 100 1000 ur chip fig.2 relative intensity vs. forward current 2.5 1.5 1.0 2.0 3.0 page 3/4 part no. LUR21233
the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. solderability test thermal shock test solder resistance test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. page 4/4 mil-std-202:103b jis c 7021: b-11 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only reliability test: the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) high temperature storage test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) high temperature high humidity test low temperature storage test the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) test condition operating life test test item this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. description part no. LUR21233
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